Bundle: Thin Film set up

The tools for single layer thin film measurement ranging from 10 nm to 50 μm with a resolution of 1 nm.

Kuvaus

For single layer thin film measurements, this system provides the needed tools. It includes a reflection probe and a stage. It can measure thin films ranging from 10 nm to 50 μm with a resolution of 1 nm. It supports UV/VIS and NIR measurements from 200 – 1100 nm.

Typical applications:
• Semi-conductor industry
• Solar panels
• Coating

Tuotetuki: Linkki valmistajan tuotesivulle